Preface |
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xiii | |
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Mechanical Design and Fabrication |
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1 | (75) |
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2 | (10) |
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2 | (1) |
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Machines for Making Holes |
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2 | (2) |
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4 | (3) |
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7 | (2) |
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Electrical Discharge Machining (EDM) |
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9 | (1) |
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9 | (1) |
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Tools for Working Sheet Metal |
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10 | (1) |
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10 | (2) |
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Tolerance and Surface Quality for Shop Processes |
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12 | (1) |
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12 | (6) |
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Parameters to Specify Properties of Materials |
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13 | (1) |
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Heat Treating and Cold Working |
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14 | (2) |
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Effect of Stress Concentration |
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16 | (2) |
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18 | (7) |
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18 | (2) |
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20 | (1) |
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21 | (1) |
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22 | (1) |
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22 | (1) |
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23 | (1) |
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24 | (1) |
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25 | (14) |
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25 | (3) |
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28 | (1) |
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29 | (1) |
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29 | (1) |
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30 | (1) |
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31 | (2) |
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33 | (1) |
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34 | (1) |
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34 | (3) |
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Joints in Piping and Pressure Vessels |
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37 | (2) |
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39 | (10) |
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39 | (1) |
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Basic Principles of Mechanical Drawing |
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40 | (4) |
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44 | (2) |
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46 | (2) |
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From Design to Working Drawings |
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48 | (1) |
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Physical Principles of Mechanical Design |
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49 | (8) |
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Bending of a Beam or Shaft |
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50 | (2) |
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52 | (1) |
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52 | (2) |
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Vibration of Beams and Shafts |
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54 | (1) |
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Shaft Whirl and Vibration |
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55 | (2) |
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57 | (19) |
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57 | (2) |
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59 | (1) |
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60 | (1) |
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61 | (1) |
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62 | (1) |
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63 | (3) |
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66 | (1) |
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66 | (2) |
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68 | (8) |
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76 | (17) |
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76 | (2) |
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Chemical Composition and Chemical Properties of Some Laboratory Glasses |
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76 | (1) |
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Thermal Properties of Laboratory Glasses |
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77 | (1) |
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Optical Properties of Laboratory Glassware |
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78 | (1) |
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Mechanical Properties of Glass |
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78 | (1) |
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Laboratory Components Available in Glass |
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78 | (3) |
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78 | (1) |
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79 | (1) |
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80 | (1) |
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Graded Glass Seals and Glass-to-Metal Seals |
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81 | (1) |
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Laboratory Glassblowing Skills |
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81 | (12) |
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81 | (1) |
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82 | (1) |
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83 | (1) |
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Sealing Off a Tube: The Test-Tube End |
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84 | (1) |
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85 | (2) |
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87 | (1) |
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87 | (1) |
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88 | (1) |
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88 | (1) |
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89 | (2) |
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Grinding and Drilling Glass |
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91 | (1) |
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92 | (1) |
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92 | (1) |
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93 | (54) |
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93 | (2) |
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The Nature of the Residual Gases in a Vacuum System |
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93 | (1) |
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93 | (2) |
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95 | (1) |
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Bulk Behavior versus Molecular Behavior |
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95 | (1) |
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95 | (3) |
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Parameters for Specifying Gas Flow |
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95 | (1) |
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96 | (1) |
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96 | (1) |
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97 | (1) |
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98 | (1) |
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98 | (1) |
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Pressure and Flow Measurement |
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98 | (6) |
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98 | (2) |
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Thermal-Conductivity Gauges |
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100 | (1) |
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101 | (1) |
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101 | (2) |
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103 | (1) |
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103 | (1) |
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104 | (11) |
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105 | (4) |
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109 | (3) |
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112 | (3) |
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115 | (16) |
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115 | (3) |
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Demountable Vacuum Connections |
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118 | (2) |
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120 | (3) |
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Mechanical Motion in the Vacuum System |
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123 | (1) |
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124 | (3) |
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Molecular Beams and Gas Jets |
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127 | (3) |
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Electronics and Electricity in Vacuo |
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130 | (1) |
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Vacuum-System Design and Construction |
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131 | (16) |
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Some Typical Vacuum Systems |
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132 | (6) |
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138 | (1) |
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The Construction of Metal Vacuum Apparatus |
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139 | (3) |
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142 | (1) |
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143 | (1) |
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144 | (1) |
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145 | (1) |
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145 | (2) |
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147 | (177) |
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147 | (3) |
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Characterization and Analysis of Optical Systems |
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150 | (32) |
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Simple Reflection and Refraction Analysis |
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150 | (1) |
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151 | (11) |
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Nonimaging Light Collectors |
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162 | (1) |
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162 | (4) |
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Exact Ray Tracing and Aberrations |
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166 | (8) |
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The Use of Impedances in Optics |
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174 | (5) |
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179 | (3) |
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182 | (54) |
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182 | (5) |
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187 | (1) |
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187 | (9) |
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196 | (5) |
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201 | (3) |
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204 | (7) |
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211 | (1) |
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212 | (5) |
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217 | (2) |
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Precision Mechanical Movement Systems |
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219 | (3) |
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Devices for Positional and Orientational Adjustment of Optical Components |
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222 | (7) |
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Optical Tables and Vibration Isolation |
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229 | (1) |
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Alignment of Optical Systems |
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229 | (1) |
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Mounting Optical Components |
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230 | (2) |
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Cleaning Optical Components |
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232 | (4) |
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236 | (11) |
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Materials for Windows, Lenses, and Prisms |
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236 | (9) |
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Materials for Mirrors and Diffraction Gratings |
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245 | (2) |
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247 | (14) |
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248 | (1) |
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Radiometry: Units and Definitions |
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248 | (1) |
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249 | (1) |
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250 | (2) |
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252 | (9) |
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261 | (30) |
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General Principles of Laser Operation |
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267 | (1) |
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General Features of Laser Design |
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268 | (2) |
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270 | (13) |
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283 | (1) |
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Coupling Light from a Source to an Aperture |
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284 | (3) |
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287 | (2) |
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How to Work Safely with Light Sources |
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289 | (2) |
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Optical Dispersing Instruments |
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291 | (33) |
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Comparison of Prism and Grating Spectrometers |
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293 | (2) |
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Design of Spectrometers and Spectrographs |
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295 | (4) |
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Calibration of Spectrometers and Spectrographs |
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299 | (1) |
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Fabry---Perot Interferometers and Etalons |
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299 | (9) |
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Design Considerations for Fabry---Perot Systems |
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308 | (1) |
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Double-Beam Interferometers |
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309 | (5) |
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314 | (1) |
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314 | (4) |
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318 | (6) |
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324 | (38) |
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Basic Concepts of Charged-Particle Optics |
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324 | (3) |
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324 | (1) |
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325 | (1) |
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The Helmholtz---Lagrange Law |
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325 | (1) |
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326 | (1) |
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327 | (11) |
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Geometrical Optics of Thick Lenses |
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327 | (2) |
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329 | (2) |
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331 | (1) |
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332 | (1) |
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333 | (3) |
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336 | (2) |
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338 | (1) |
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338 | (7) |
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338 | (3) |
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Electron-Gun Design Example |
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341 | (2) |
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343 | (2) |
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345 | (9) |
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346 | (1) |
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347 | (1) |
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348 | (2) |
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350 | (1) |
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350 | (2) |
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Fringing-Field Correction |
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352 | (1) |
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Magnetic Energy Analyzers |
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353 | (1) |
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354 | (1) |
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Magnetic Sector Mass Analyzers |
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354 | (1) |
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354 | (1) |
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Dynamic Mass Spectrometers |
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355 | (1) |
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Electron- and Ion-Beam Devices: Construction |
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355 | (7) |
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355 | (1) |
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356 | (1) |
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Lens and Lens-Mount Design |
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357 | (1) |
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Charged-Particle Detection |
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358 | (1) |
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358 | (2) |
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360 | (2) |
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362 | (185) |
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362 | (20) |
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362 | (3) |
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365 | (4) |
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High-Pass and Low-Pass Circuits |
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369 | (3) |
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372 | (2) |
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The Laplace-Transform Method |
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374 | (3) |
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377 | (1) |
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Transient Response of Resonant Circuits |
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378 | (1) |
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Transformers and Mutual Inductance |
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379 | (1) |
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380 | (1) |
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380 | (1) |
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Computer-Aided Circuit Analysis |
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381 | (1) |
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382 | (20) |
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Fixed Resistors and Capacitors |
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383 | (1) |
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384 | (5) |
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389 | (9) |
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398 | (1) |
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399 | (3) |
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402 | (19) |
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403 | (3) |
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406 | (13) |
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Silicon-Controlled Rectifiers |
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419 | (1) |
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420 | (1) |
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421 | (1) |
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Amplifiers and Pulse Electronics |
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421 | (20) |
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421 | (3) |
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General Transistor-Amplifier Operating Principles |
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424 | (4) |
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Operational-Amplifier Circuit Analysis |
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428 | (4) |
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Instrumentation and Isolation Amplifiers |
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432 | (2) |
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Stability and Oscillators |
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434 | (1) |
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Detecting and Processing Pulses |
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435 | (6) |
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441 | (6) |
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Power-Supply Specifications |
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442 | (1) |
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Regulator Circuits and Programmable Power Supplies |
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443 | (2) |
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445 | (2) |
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447 | (20) |
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447 | (1) |
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447 | (1) |
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448 | (1) |
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448 | (1) |
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448 | (2) |
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450 | (3) |
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Digital-to-Analog Conversion |
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453 | (5) |
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458 | (2) |
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460 | (4) |
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Implementing Logic Functions |
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464 | (3) |
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467 | (24) |
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467 | (2) |
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Voltage Levels and Timing |
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469 | (1) |
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469 | (1) |
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470 | (2) |
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472 | (2) |
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Multiple Signal Sources: Data Loggers |
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474 | (1) |
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Standardized Data-Acquisition Systems |
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474 | (5) |
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479 | (3) |
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Personal Computer (PC) Control of Experiments |
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482 | (9) |
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Extraction of Signal from Noise |
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491 | (9) |
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491 | (1) |
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Optimizing the Signal-to-Noise Ratio |
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492 | (1) |
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The Lock-In Amplifier and Gated Integrator or Boxcar |
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493 | (1) |
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494 | (1) |
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495 | (1) |
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Coincidence and Time-Correlation Techniques |
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496 | (4) |
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500 | (8) |
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Electrical Grounds and Safety |
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500 | (3) |
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Electrical Pickup: Capacitive Effects |
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503 | (1) |
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Electrical Pickup: Inductive Effects |
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504 | (1) |
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Electromagnetic Interference and r.f.i |
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505 | (1) |
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505 | (1) |
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506 | (2) |
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Hardware and Construction |
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508 | (26) |
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508 | (1) |
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Component Selection and Construction Techniques |
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508 | (5) |
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513 | (10) |
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523 | (1) |
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524 | (4) |
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528 | (6) |
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534 | (13) |
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534 | (1) |
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535 | (2) |
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537 | (1) |
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538 | (3) |
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541 | (6) |
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547 | (53) |
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547 | (1) |
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Noise in Optical Detection Process |
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548 | (2) |
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548 | (1) |
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549 | (1) |
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Generation-Recombination (gr) Noise |
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549 | (1) |
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549 | (1) |
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Figures of Merit for Detectors |
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550 | (4) |
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550 | (1) |
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550 | (1) |
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551 | (1) |
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552 | (1) |
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Frequency Response and Time Constant |
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553 | (1) |
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553 | (1) |
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554 | (12) |
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554 | (1) |
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555 | (1) |
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Photocathode and Dynode Materials |
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556 | (5) |
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Practical Operating Considerations for Photomultiplier Tubes |
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561 | (5) |
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Photoconductive Detectors |
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566 | (6) |
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Photovoltaic Detectors (Photodiodes) |
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572 | (6) |
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574 | (3) |
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Geiger Mode Avalanche Photodetectors |
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577 | (1) |
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578 | (4) |
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578 | (1) |
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578 | (1) |
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Lateral Effect Photodetectors |
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578 | (2) |
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580 | (1) |
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581 | (1) |
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Signal-to-Noise Ratio Calculations |
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582 | (3) |
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582 | (1) |
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Direct Detection with p--i--n Photodiodes |
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582 | (2) |
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Direct Detection with APDs |
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584 | (1) |
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585 | (1) |
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Particle and Ionizing Radiation Detectors |
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585 | (6) |
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589 | (2) |
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591 | (1) |
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591 | (1) |
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591 | (5) |
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593 | (1) |
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593 | (1) |
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594 | (1) |
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595 | (1) |
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Electronics to be Used With Detectors |
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596 | (1) |
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597 | (3) |
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597 | (1) |
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597 | (2) |
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599 | (1) |
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Measurement and Control of Temperature |
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600 | (25) |
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The Measurement of Temperature |
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600 | (13) |
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601 | (1) |
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602 | (3) |
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605 | (4) |
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Semiconductor Thermometers |
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609 | (1) |
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Temperatures Very Low: Cryogenic Thermometry |
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610 | (1) |
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611 | (1) |
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New, Evolving, and Specialized Thermometry |
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|
612 | (1) |
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Comparison of Main Categories of Thermometers |
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|
612 | (1) |
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612 | (1) |
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The Control of Temperature |
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613 | (12) |
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Temperature Control at Fixed Temperatures |
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|
613 | (1) |
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Temperature Control at Variable Temperatures |
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|
613 | (8) |
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|
621 | (2) |
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|
623 | (2) |
Index |
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625 | |