Characterization of Condensed Matter A comprehensive and accessible introduction to the characterization of condensed materials
The characterization of condensed materials is a crucial aspect of materials science. The science underlying this area of research and analysis is interdisciplinary, combining electromagnetic spectroscopy, surface and interface testing methods, physiochemical analysis methods, and more. All of this must be brought to bear in order to understand the relationship between microstructures and larger-scale properties of condensed matter.
Characterization of Condensed Matter: An Introduction to Composition, Microstructure, and Surface Methods introduces the technologies involved in the characterization of condensed matter and their many applications. It incorporates more than a decades experience in teaching a successful undergraduate course in the subject and emphasizes accessibility and continuously reinforced learning. The result is a survey which promises to equip students with both underlying theory and real experimental instances of condensed matter characterization.
Characterization of Condensed Matter readers will also find:
- Detailed treatment of techniques including electromagnetic spectroscopy, X-ray diffraction, X-ray absorption, electron microscopy, surface and element analysis, and more
- Incorporation of concrete experimental examples for each technique
- Exercises at the end of each chapter to facilitate understanding
Characterization of Condensed Matter is a useful reference for undergraduates and early-career graduate students seeking a foundation and reference for these essential techniques.
I. Introduction
1.1 Evolution of Universe and Basic Particles Constructing Condensed Matter
1.2 Condensed matter and materials
1.3 Classification of materials
1.4 Atomic structure and inter-atomic bonding
1.5 Relationship of structures, properties and performances of materials
1.6 Advanced characterization methods of materials based on the progress of modern science
1.7 Exercises
II. Microstructure of Solid State Matter
2.1 Lattice and Crystal structure
2.2 Unit cells and crystal systems
2.3Crystallographic directions and planes
2.4 Closed-packed crystal structures
2.5 Specific crystal structures: quasicrystal, nanocrystals and amorphous crystals
2.6 Exercises
III. X-ray based microstructure and phase characterizations
3.1 Principle of X-ray generation
3.2 Nature of X-ray
3.3 X-ray sources for Crystallographic Studies
3.4 X-ray diffraction principle in crystal structure analysis
3.5 Mathematical calculation for specific crystal structures based on X-ray diffraction
3.6 Analytical methods for specific crystal structures based on X-ray diffraction
3.7 X-ray Diffraction by Crystal
3.8 X-ray absorbance spectroscopy(XAS)
3.9 Exercises
IV. Optical spectroscopy
4.1 UV-vis-NIR
4.2 IR and FTIR
4.3 Raman spectroscopy and X-ray Raman scattering (XRS)
4.4 Photoluminescence spectroscopy
4.5 Exercises
V. Electron microspectroscope
5.1 SEM and HR-SEM
5.2 TEM and HR-SEM
5.3 Spherical aberration corrected TEM
5.4 Environmental TEM
5.5 Holography
5.6 Exercises
VI. Neutron scattering
6.1 Interaction principle between neutron and condensed matter
6.2 Neutron scattering sources and instrumentation
6.3 Information of condensed matter from neutron scattering
6.4 Exercises
VII Scanning probe microscopy and spectroscopy
7.1 AFM
7.2 STM
7.3 Non-linear spectroscopy
7.4 Exercises
VIII. Thermal method
8.1 TGA
8.2 DTA
8.3 DSC
8.4 TPR/TPD/TPO
IX. Nuclear Magnetic Resonance Spectroscopy
X. Electron Paramagnetic Resonance Spectroscopy
XI. Mossbauer Spectroscopy
XII. Mass spectroscopy
XIII. Surface analysis and composition identification techniques
13.1 XES (X-ray emission spectroscopy)
13.2 Energy dispersive X-ray spectroscopy (EDS)
13.3 Wavelength disperse X-ray spectroscopy (WDX)
13.4 XPS (X-ray photoelectron spectroscopy)
13.5 XRF (X-ray fluorescence analysis)
13.6 Exercises
XIV. Recent progress in advanced characterization of materials
14.1 Comparison in elastic and inelastic X-ray scattering techniques
14.2 X-ray focusing lens for high resolution X-ray imaging techniques
14.3 Other methods for crystal structures characterization and composition analysis
Yujun Song, PhD, is Professor in Physics at University of Science and Technology Beijing, China, and Deputy Director of Center for Modern Physics Technology. He has previously studied and worked in both the United States and Canada. In addition to his extensive research into subjects such as surface and interface-controlled fabrication of functional materials for information technology, new energy and catalysis, and biomedicine, he is the long-time instructor of graduate and undergraduate courses on the characterization of condensed matter.
Qingwei Liao, PhD, is Associate Professor at Beijing Information Science & Technology University, China. She has previously held a visiting faculty position at Harvard University and has published extensively on nanomaterials, applied physics, and related subjects. She serves as the main lecturer of courses like modern analytical testing methods for graduate students.
