Conference Committee |
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vii | |
Preface |
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ix | |
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Holography in the '60s and '70s-A View from the Fringes |
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2 | (12) |
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Topic 1: New Methods and Tools for Data Acquisition and Processing |
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Coherence Holography: A Thought on Synthesis and Analysis of Optical Coherence Fields (invited paper) |
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14 | (8) |
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The Polarization Approach in Measuring Correlation Properties of Optical Fields |
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22 | (6) |
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Real-time Coherence Holography |
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28 | (6) |
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Coherence and Correlation in Digital Holography |
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34 | (7) |
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Analysis of fringe formation and localization in optical interferometry using optical cohernce |
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41 | (9) |
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Quantitative Phase Imaging in Microscopy (invited paper) |
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50 | (7) |
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Comparison and unification of speckle-based phase retrieval and hologrphy with applications in phasefront alignment and recognition |
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57 | (6) |
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High Precision Object Phase Reconstruction with Modified Phase Retrieval |
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63 | (9) |
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Phase retrieval with an LCoS display: characterization and application |
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72 | (6) |
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Digital dynamic-fringe pattern processing without frequency carrier, using wideband phase-shifting algorithms |
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78 | (9) |
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Error-compensating phase-shifting Fizeau interferometry with a wavelength-tunable laser diode |
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87 | (6) |
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Lateral Shearing Interferometer based on a Spatial Light Modulator in the Fourier Plane |
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93 | (6) |
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Digital phase shifting holography and holographic interferometry |
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99 | (7) |
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Fourier-transform method with high accuracy by use of iterative technique narrowing the spectra of a fringe pattern |
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106 | (6) |
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Fringe pattern processing using a new adaptive and steereable asynchronous algorithm |
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112 | (6) |
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Synthetic Aperture Digital Holography (invited paper) |
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118 | (5) |
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A new application of the Delaunay triangulation: The processing of speckle interferometry signals |
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123 | (9) |
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Phase analysis of interference signal with optical Hilbert transform based on orthogonal linear polarization phase shifting |
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132 | (6) |
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Digital Fourier-transform processing for analysis of speckle photographs |
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138 | (4) |
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Wavefront evaluation in phase shifting interferometry based on recurrence fringe processing with 3D prediction |
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142 | (7) |
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White-light fringe analysis with low-cost CCD camera |
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149 | (4) |
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Design and assessment of Differential Phase-Shifting Algorithms by means of their Fourier representation |
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153 | (7) |
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A Nonlinear Technique for Automatic Twin-Image and Zero-Order Term Suppression in Digital Holographic Microscopy |
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160 | (4) |
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Modified two-step phase-shifting algorithm: analysis, demonstration, and application |
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164 | (6) |
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The Used of Reference Wave for Diagnostics of Phase Singularities |
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170 | (4) |
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New convolution algorithms for reconstructing extended objects encoded in digitally recorded holograms |
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174 | (6) |
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Reconstruction of noisy measured sharp edges at thin sheet metal components |
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180 | (4) |
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Reduction of speckles in digital holographic interferometry |
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184 | (5) |
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Normalization and denoising in a multi-source and multi-camera profilometric system |
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189 | (4) |
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Automated Phase Map Referencing Against Historic Phase Map Data |
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193 | (4) |
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Numerical multiplexing and de-multiplexing techniques for efficient storage and transmission of digital holographic information |
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197 | (4) |
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Fringe Pattern Normalization Using Bidimensional Empirical Mode Decomposition and the Hilbert Transform |
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201 | (4) |
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Complementary Filtering Approach to Enhance the Optical Reconstruction of Holograms from a Spatial Light Modulator |
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205 | (6) |
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Combination of Phase Stepping and Fringe Tracking to Evaluate Strain from Noisy DSPI Data |
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211 | (4) |
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Influence of filter operators on 3D coordinate calculation in fringe projection systems |
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215 | (6) |
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Polarization interferometry of singular structure of organic crystal polarization properties |
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221 | (4) |
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Zero order interferometry technique for measuring the Lyapunov's Maximal index in iptical fields |
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225 | (5) |
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Orientation-selective spiral-phase contrast microscopy |
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230 | (6) |
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Topic 2: Application Enhanced Technologies |
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Model-based white light interference microscopy for metrology of transparent film stacks and optically-unresolved structures (invited paper) |
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236 | (8) |
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Limitations and Optimization of Low-coherence Interferometry for High Precision Microscopic Form Measurement |
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244 | (6) |
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Instantaneous Wavelength Detection by a Whole-Field k-space Method |
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250 | (6) |
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Limiting aspects in length measurements by interferometry |
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256 | (7) |
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Aspects of design and the characterization of a high resolution heterodyne displacement interferometer |
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263 | (6) |
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The femtosecond optical synthesizer as a tool for determination of the refractive index of air in ultra-precise measurement of lengths |
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269 | (6) |
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Digital holographic microscopy with a simultaneous phase-shifting interferometer for measuring the angular spectrum generated by micro-optical structures (invited paper) |
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275 | (8) |
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Resolution enhancement in digital holography by a two-dimensional electro-optically tunable phase grating |
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283 | (6) |
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Resolution improvement in lensless digital holographic interferometry |
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289 | (9) |
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Digital holography catching up with analogue holography both in resolution and in field of view with a bottom-line camera |
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298 | (6) |
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Fresnel and Fourier digital holography architectures: a comparison |
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304 | (5) |
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The last Word on Three-Flat Calibration - are we there yet? |
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309 | (9) |
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A New Flatness Reference Measurement System Based on Deflectometry and Difference Deflectometry |
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318 | (6) |
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Quasi absolute Test for Aspherics via dual Wavefront Holograms and a radial Shear Position |
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324 | (6) |
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Rapid and flexible measurement of precision aspheres |
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330 | (9) |
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Measurement of the shape of objects by the interferometry with two wavelengths |
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339 | (6) |
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Recording-plane division multiplexing (RDM) in pulsed digital holography for optical metrology |
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345 | (5) |
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Identification of deformation components in TV holography and digital holography |
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350 | (4) |
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Extending the capabilities of the sphere interferometer of PTB by a stitching procedure |
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354 | (4) |
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Fringe contrast improving in low coherence interferometry by white light emitting diodes spectrum shaping |
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358 | (6) |
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Absolute testing of aspherics in transmitted light using an amplitude DOE |
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364 | (5) |
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MEMS Calibration Standards for the Optical Measurement of Displacements |
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369 | (6) |
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About the feasibility of nearfield-farfield transformers based on optical metamaterials |
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375 | (9) |
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Analogy of white-light interferometry and pulse shaping |
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384 | (6) |
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Topic 3: 4D Optical Metrology over a Large Scale Range |
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Nanomeasuring and Nanopositioning Engineering (invited paper) |
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390 | (8) |
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Reconstruction of Shape using Gradient Measuring Optical Systems |
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398 | (7) |
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Metrological SPM with positioning controlled by green light interferometry |
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405 | (6) |
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Measuring Shape and Surfaces down to the Nanometer and Nanosecond scales by Digital Holographic Microscopy |
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411 | (5) |
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Deflectometry: 3D-Metrology from Nanometer to Meter |
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416 | (6) |
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3-D Sensing for Microstructures Using Dynamic DOEs |
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422 | (6) |
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Doppler phase-shift fringe analysis and digital holography using high-speed digital camera |
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428 | (5) |
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Shape and Deformation Measurement of Moving Object by Sampling Moire Method |
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433 | (6) |
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New Interferometry Tools for AeroOptics |
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439 | (6) |
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Dynamic Fizeau Interferometers |
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445 | (10) |
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Surface contouring of vibrating objects using quadrature transform |
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455 | (6) |
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Development and Application of a 10 Hz Nd: YAG Double Pulse Laser for Vibration Measurements with Double Pulse ESPI |
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461 | (6) |
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Combining novel fringe analysis and photogrammetry for industrial shape measurement |
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467 | (5) |
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Digital holographic interferometry for deformation measurement by means of an acoustical device |
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472 | (5) |
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Pump-probe interference microscope observation for femtosecond-laser induced phenomena |
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477 | (4) |
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Three-dimensional shape measurement of dynamic objects with spatially isolated surfaces |
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481 | (4) |
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Optical design of a DOE-based laser interferometer for inspection of MEMS/MOEMS |
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485 | (4) |
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Time Resolved High Resolution Shape and Colour Measurement using Fringe Projection |
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489 | (4) |
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Dynamic 3-D shape measurement techniques with marked fringes tracking |
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493 | (4) |
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Optical measurement and color map projection system to highlight geometrical features on free form surfaces |
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497 | (4) |
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Digital holographic recording of large scale objects for metrology and display |
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501 | (4) |
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Multiwavelength laser interferometry |
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505 | (4) |
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Accurate and fast three-dimensional imaging with use of fringe projection profilometry |
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509 | (4) |
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3D vibration analysis of granular materials with two-color digital Fresnel hologrphy |
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513 | (6) |
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System for transient spatio-temporal (4D) vibration imaging and non-destructive inspection |
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519 | (4) |
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Microelements vibration measurement using quasi-heterodyning method and smart-pixel camera |
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523 | (5) |
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Dynamic multipoint vibrometry using spatial light modulators |
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528 | (6) |
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Topic 4: Hybrid Measurement Techniques |
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Optoelectronic method for device characterization and experimental validation of operational performance (invited paper) |
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534 | (8) |
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Computational inverse holographic imaging: toward perfect reconstruction of wavefield distributions |
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542 | (8) |
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Cooperative Sensor Approach for holistic geometrical Measurement Tasks on Cutting Tools |
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550 | (6) |
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View Planning for 3D Reconstruction using Time-of-Flight Camera Data as a-priori Information |
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556 | (6) |
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Stereo vision based approach for extracting features from digital holograms |
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562 | (6) |
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Flexible Combination of Optical Metrology Strategies for the Automated Assembly of Solid State Lasers |
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568 | (4) |
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A Numerical Simulation Benchmark of Tilt Scanning Interferometry for 3D Metrology |
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572 | (4) |
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A virtual telecentric fringe projection system |
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576 | (4) |
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Inspection of an extended surface by an active 3D multiresolution technique |
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580 | (4) |
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Automated Multiscale Measurement System for micro optical elements |
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584 | (8) |
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Simulation based sensitivity analysis and optimization of Scatterometry measurements for future semiconductor technology nodes |
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592 | (4) |
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Electronic Speckle Pattern Interferometry at Long Infrared Wavelengths. Scattering Requirements |
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596 | (6) |
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Topic 5: New Optical Sensors and Measurement Systems |
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Novel interferometric measurement systems for the characterization of micro-optics (invited paper) |
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602 | (9) |
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Design of a micro-optical low coherent interferometer array for the characterisation of MEMS and MOEMS |
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611 | (7) |
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Looking for a new generation of MEMS-type confocal microscopes |
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618 | (4) |
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Radial in-plane achromatic digital speckle pattern interferometer using an axis-symmetrical diffractive optical element |
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622 | (6) |
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Wavefront Sensor Design based on a Micro-Mirror Array for a High Dynamic Range Measurement at a High Lateral Resolution |
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628 | (6) |
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Intellectual property in industry and academia: where interests merge? (invited paper) |
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634 | (14) |
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Moire interferometer for surface mapping with liquid crystal grids |
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648 | (8) |
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High resolution tilt scanning interferometry system for full sensitivity depth-resolved displacement measurements in weakly scattering mateials |
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656 | (6) |
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Multifunctional phase-stepping interferometer for measurement in real time |
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662 | (8) |
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A Wonderful World of Holography, Interferometry, and Optical Testing (honorary lecture) |
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670 | (10) |
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Multifunctional Encoding System for Assessment of Movable Cultural Heritage |
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680 | (8) |
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Investigation of electronic PCB component with two-color digital holographic interferometry |
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688 | (5) |
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Integrated Microinterferometric Sensor |
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693 | (4) |
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High Precision Measurement of plane-parallel Parts |
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697 | (4) |
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Lateral Shearing Interferometry with Simultaneous Detection of both Gradient Fields on a Common Detector Grid |
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701 | (4) |
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Near infrared large aperture (24 inches) interferometer system development |
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705 | (4) |
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Interior Geometry Inspection Using Rerouted Fringe Projection |
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709 | (4) |
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A Cellular Force Microscopic System for Cell Mechanics Investigation |
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713 | (4) |
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Candle flame analysis by digital three-wavelength holographic interferometry |
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717 | (4) |
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Moire fringe generation and phase shifting using a consumer product LCD projector |
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721 | (5) |
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Speckle velocimetry for high accuracy and multi-dimensional odometry |
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726 | (4) |
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Determination of Refractive Index Changes in Biconical Optical Fiber Taper |
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730 | (4) |
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Prosthodontic crown mechanical integrity study using Speckle Interferometry |
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734 | (4) |
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Monitoring of Drying Process of Paints using Lensless Fourier Transform Digital Holography |
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738 | (5) |
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On the Digital Holographic Interferometry of Fibrous Materials: Opto-Mechanical Properties of Fibres |
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743 | (4) |
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Geometrical camera calibration using lasers and diffractive optical elements |
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747 | (4) |
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Mesurement of the local displacement field produced by a microindentation using speckle interferometry. Its application to analyse coating adhesion |
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751 | (4) |
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Space-Time Multiplexing in a Stereo-photogrammetry Setup |
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755 | (5) |
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Interference Investigation of Concrete Structure and Dynamics During Hydration |
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760 | (4) |
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Off-axis Reconstruction Method for Displacement and Strain Distribution Measurement with Phase-Shifting Digital Holography |
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764 | (4) |
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``Flying Triangulation'': A motion-robust optical 3D sensor principle |
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768 | (4) |
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Laser direct writing of high resolution structures on curved substrates: evaluation of the writing precision |
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772 | (6) |
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Scanning Holography - A tutorial |
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778 | (9) |
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Appendix: New Products |
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787 | |