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Fringe 2009: 6th International Workshop on Advanced Optical Metrology 2009 ed. [Multiple-component retail product]

  • Formāts: Multiple-component retail product, 792 pages, height x width: 235x155 mm, weight: 1382 g, XXIV, 792 p. With CD-ROM., 1 Item
  • Izdošanas datums: 11-Sep-2009
  • Izdevniecība: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
  • ISBN-10: 3642030505
  • ISBN-13: 9783642030505
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  • Formāts: Multiple-component retail product, 792 pages, height x width: 235x155 mm, weight: 1382 g, XXIV, 792 p. With CD-ROM., 1 Item
  • Izdošanas datums: 11-Sep-2009
  • Izdevniecība: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
  • ISBN-10: 3642030505
  • ISBN-13: 9783642030505
The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state of the art and the impact of Optical Metrology in Imaging, Surface Monitoring, Stress Analysis, Non-Destructive Testing, Quality Control, and related fields. Topics of particular interest are: new Methods and Tools for the Generation, Acquisition, Processing, and Evaluation of Data in Optical Metrology (Digital Wavefront Engineering), application Enhanced Technologies in Optical Metrology (Addressing enhanced Resolution, Reliability and Flexibility), 4D Optical Metrology over a Large Scale Range (from Macro to Nano), Hybrid Measurement Techniques (Sensor Fusion and the Unification of Modeling, Simulation and Experiment), New Optical Sensors and Measurement Systems for Industrial Inspection. Special emphasis is put on modern measurement strategies, taking into account the active combination of physical modeling, computer aided simulation and experimental data acquisition. Special emphasis is directed towards new approaches for the extension of existing resolution limits that open the gates to wide scale metrology, ranging from nano to macro, by using advanced optical sensor systems.

This book presents the latest in Optical Metrology in Imaging, Surface Monitoring, Stress Analysis, Quality Control and related fields. Special emphasis is put on modern measurement strategies and new approaches for the extension of existing resolution limits.
Conference Committee vii
Preface ix
Key Note
Holography in the '60s and '70s-A View from the Fringes
2(12)
C. M. Vest
Topic 1: New Methods and Tools for Data Acquisition and Processing
Coherence Holography: A Thought on Synthesis and Analysis of Optical Coherence Fields (invited paper)
14(8)
M. Takeda
W. Wang
D. N. Naik
The Polarization Approach in Measuring Correlation Properties of Optical Fields
22(6)
O. V. Angelsky
C. Y. Zenkova
N. V. Gorodynska
Real-time Coherence Holography
28(6)
D. N. Naik
T. Ezawa
Y. Miyamoto
M. Takeda
Coherence and Correlation in Digital Holography
34(7)
I. Yamaguchi
Analysis of fringe formation and localization in optical interferometry using optical cohernce
41(9)
C. S. Narayanamurthy
Quantitative Phase Imaging in Microscopy (invited paper)
50(7)
C. J. Sheppard
S. S. Kou
S. Mehta
Comparison and unification of speckle-based phase retrieval and hologrphy with applications in phasefront alignment and recognition
57(6)
P. F. Almoro
G. Pedrini
F. Zhang
A. M. S. Maallo
A. Anand
P. N. Gundu
W. Wang
A. Asundi
W. Osten
S. G. Hanson
High Precision Object Phase Reconstruction with Modified Phase Retrieval
63(9)
S. Forster
H. Gross
Phase retrieval with an LCoS display: characterization and application
72(6)
C. Kohler
F. Zhang
W. Osten
Digital dynamic-fringe pattern processing without frequency carrier, using wideband phase-shifting algorithms
78(9)
J. C. Estrada
F. Mendoza-Santoyo
M. de la Torre
T. Saucedo
Error-compensating phase-shifting Fizeau interferometry with a wavelength-tunable laser diode
87(6)
Y. Ishii
S. Idoi
H. Fujita
H. Funamizu
Lateral Shearing Interferometer based on a Spatial Light Modulator in the Fourier Plane
93(6)
C. Falldorf
R. Klattenhoff
A. Gesierich
C. V. Kopylow
R. Bergmann
Digital phase shifting holography and holographic interferometry
99(7)
M. Kujawinska
N. Kumar
A. Michalkiewicz
Fourier-transform method with high accuracy by use of iterative technique narrowing the spectra of a fringe pattern
106(6)
S. Nakayama
H. Toba
N. Fujiwara
T. Gemma
M. Takeda
Fringe pattern processing using a new adaptive and steereable asynchronous algorithm
112(6)
J. A. Quiroga
J. A. Gomez-Pedrero
M. Servin
Synthetic Aperture Digital Holography (invited paper)
118(5)
J. Rosen
B. Katz
A new application of the Delaunay triangulation: The processing of speckle interferometry signals
123(9)
S. Equis
P. Jacquot
Phase analysis of interference signal with optical Hilbert transform based on orthogonal linear polarization phase shifting
132(6)
V. D. Madjarova
H. Kadono
N. Kurita
Digital Fourier-transform processing for analysis of speckle photographs
138(4)
K. A. Stetson
Wavefront evaluation in phase shifting interferometry based on recurrence fringe processing with 3D prediction
142(7)
I. Gurov
A. Karpets
E. Vorobeva
White-light fringe analysis with low-cost CCD camera
149(4)
Z. Buchta
P. Jedlicka
M. Matejka
V. Kolarik
B. Mikel
J. Lazar
O. Cip
Design and assessment of Differential Phase-Shifting Algorithms by means of their Fourier representation
153(7)
M. Miranda
B. V. Dorrio
A Nonlinear Technique for Automatic Twin-Image and Zero-Order Term Suppression in Digital Holographic Microscopy
160(4)
N. Pavillon
C. S. Seelamantula
M. Unser
C. Depeursinge
Modified two-step phase-shifting algorithm: analysis, demonstration, and application
164(6)
X.-F. Meng
X. Peng
L.-Z. Cai
A.-M. Li
J.-P. Guo
Y.-R. Wang
The Used of Reference Wave for Diagnostics of Phase Singularities
170(4)
O. V. Angelsky
A. P. Maksimyak
P. P. Maksimyak
New convolution algorithms for reconstructing extended objects encoded in digitally recorded holograms
174(6)
P. Picart
P. Tankam
D. Mounier
Z. Peng
J.-C. Li
Reconstruction of noisy measured sharp edges at thin sheet metal components
180(4)
J. Weickmann
A. Liedl
P.-F. Brenner
A. Weckenmann
Reduction of speckles in digital holographic interferometry
184(5)
S. Hertwig
H. Babovsky
A. Kiessling
R. Kowarschik
Normalization and denoising in a multi-source and multi-camera profilometric system
189(4)
E. Stoykova
A. Gotchev
V. Sainov
Automated Phase Map Referencing Against Historic Phase Map Data
193(4)
R. M. Groves
D. Derauw
C. Thizy
I. Alexeenko
W. Osten
M. Georges
V. Tornari
Numerical multiplexing and de-multiplexing techniques for efficient storage and transmission of digital holographic information
197(4)
M. Paturzo
P. Memmolo
A. Tulino
A. Finizio
L. Miccio
P. Ferraro
Fringe Pattern Normalization Using Bidimensional Empirical Mode Decomposition and the Hilbert Transform
201(4)
M. B. Bernini
A. Federico
G. H. Kaufmann
Complementary Filtering Approach to Enhance the Optical Reconstruction of Holograms from a Spatial Light Modulator
205(6)
M. Agour
C. Falldorf
C. von Kopylow
Combination of Phase Stepping and Fringe Tracking to Evaluate Strain from Noisy DSPI Data
211(4)
E. Hack
Influence of filter operators on 3D coordinate calculation in fringe projection systems
215(6)
C. Brauer-Burchardt
M. Heinze
C. Munkelt
P. Kuhmstedt
G. Notni
Polarization interferometry of singular structure of organic crystal polarization properties
221(4)
S.B. Yermolenko
M.P. Gorsky
Y. A. Ushenko
A.G. Pridiy
Zero order interferometry technique for measuring the Lyapunov's Maximal index in iptical fields
225(5)
M.S. Gavrylyak
A. P. Maksimyak
P. P. Maksimyak
Orientation-selective spiral-phase contrast microscopy
230(6)
G. Situ
M. Warber
G. Pedrini
W. Osten
Topic 2: Application Enhanced Technologies
Model-based white light interference microscopy for metrology of transparent film stacks and optically-unresolved structures (invited paper)
236(8)
P. de Groot
X. Colonna de Lega
J. Liesener
Limitations and Optimization of Low-coherence Interferometry for High Precision Microscopic Form Measurement
244(6)
P. Lehmann
J. Niehues
Instantaneous Wavelength Detection by a Whole-Field k-space Method
250(6)
A. Davila
J. M. Huntley
P. D. Ruiz
J. M. Coupland
Limiting aspects in length measurements by interferometry
256(7)
R. Schodel
Aspects of design and the characterization of a high resolution heterodyne displacement interferometer
263(6)
C. Weichert
J. Flugge
R. Koning
H. Bosse
R. Tutsch
The femtosecond optical synthesizer as a tool for determination of the refractive index of air in ultra-precise measurement of lengths
269(6)
O. Cip
R. Smid
B. Mikel
M. Cizek
B. Ruzicka
J. Lazar
Digital holographic microscopy with a simultaneous phase-shifting interferometer for measuring the angular spectrum generated by micro-optical structures (invited paper)
275(8)
B. Lee
J. Hahn
Y. Lim
H. Kim
E.-H. Kim
Resolution enhancement in digital holography by a two-dimensional electro-optically tunable phase grating
283(6)
M. Paturzo
A. Finizio
S. De Nicola
P. Ferraro
Resolution improvement in lensless digital holographic interferometry
289(9)
D. Claus
M. Fritzsche
B. Timmerman
P. Bryanston-Cross
Digital holography catching up with analogue holography both in resolution and in field of view with a bottom-line camera
298(6)
F. Gyimesi
V. Borbely
Z. Fuzessy
B. Raczkevi
Fresnel and Fourier digital holography architectures: a comparison
304(5)
D. P. Kelly
D. S. Monaghan
N. Pandey
B. M. Hennelly
The last Word on Three-Flat Calibration - are we there yet?
309(9)
J. Burke
B. Oreb
A New Flatness Reference Measurement System Based on Deflectometry and Difference Deflectometry
318(6)
G. Ehret
M. Schulz
M. Stavridis
C. Elster
Quasi absolute Test for Aspherics via dual Wavefront Holograms and a radial Shear Position
324(6)
K. Mantel
I. Harder
E. Geist
N. Lindlein
Rapid and flexible measurement of precision aspheres
330(9)
E. Garbusi
G. Baer
C. Pruss
W. Osten
Measurement of the shape of objects by the interferometry with two wavelengths
339(6)
P. Pavlicek
G. Hausler
Recording-plane division multiplexing (RDM) in pulsed digital holography for optical metrology
345(5)
X. Wang
C. Yuan
H. Zhai
Identification of deformation components in TV holography and digital holography
350(4)
J. Kornis
R. Sefel
Extending the capabilities of the sphere interferometer of PTB by a stitching procedure
354(4)
G. Bartl
A. Nicolaus
Fringe contrast improving in low coherence interferometry by white light emitting diodes spectrum shaping
358(6)
A. Pakula
L. Salbut
Absolute testing of aspherics in transmitted light using an amplitude DOE
364(5)
A. Berger
K. Mantel
I. Harder
N. Lindlein
MEMS Calibration Standards for the Optical Measurement of Displacements
369(6)
J. Gaspar
M. E. Schmidt
G. Pedrini
W. Osten
O. Paul
About the feasibility of nearfield-farfield transformers based on optical metamaterials
375(9)
S. Maisch
P. Schau
K. Frenner
W. Osten
Analogy of white-light interferometry and pulse shaping
384(6)
R. Berger
W. Osten
Topic 3: 4D Optical Metrology over a Large Scale Range
Nanomeasuring and Nanopositioning Engineering (invited paper)
390(8)
G. Jager
E. Manske
T. Hausotte
H.-J. Buchner
Reconstruction of Shape using Gradient Measuring Optical Systems
398(7)
J. Seewig
T. Damm
J. Frasch
D. Kauven
S. Rau
J. Schnebele
Metrological SPM with positioning controlled by green light interferometry
405(6)
J. Lazar
P. Klapetek
O. Cip
M. Cizek
J. Hrabina
M. Sery
Measuring Shape and Surfaces down to the Nanometer and Nanosecond scales by Digital Holographic Microscopy
411(5)
C. Depeursinge
I. Bergoend
N. Pavillon
J. Kuhn
T. Colomb
F. Montfort
E. Cuche
Y. Emery
Deflectometry: 3D-Metrology from Nanometer to Meter
416(6)
G. Hausler
M. C. Knauer
C. Faber
C. Richter
S. Peterhansel
C. Kranitzky
K. Veit
3-D Sensing for Microstructures Using Dynamic DOEs
422(6)
S. Dong
X. Peng
Y. Guan
A. Li
Y. Yin
J. Tian
Doppler phase-shift fringe analysis and digital holography using high-speed digital camera
428(5)
T. Yatagai
D. Barada
Shape and Deformation Measurement of Moving Object by Sampling Moire Method
433(6)
Y. Morimoto
M. Fujigaki
A. Masaya
K. Shimo
New Interferometry Tools for AeroOptics
439(6)
J. Trolinger
V. Markov
Dynamic Fizeau Interferometers
445(10)
B. Kimbrough
B. Medower
J. Millerd
Surface contouring of vibrating objects using quadrature transform
455(6)
R. Legarda-Saenz
R. Rodriguez-Vera
J. A. Rayas
Development and Application of a 10 Hz Nd: YAG Double Pulse Laser for Vibration Measurements with Double Pulse ESPI
461(6)
E. H. Nosekabel
W. Honsberg
R. Kelnberger
Combining novel fringe analysis and photogrammetry for industrial shape measurement
467(5)
Y. R. Huddart
J. D. R. Valera
A. J. Moore
Digital holographic interferometry for deformation measurement by means of an acoustical device
472(5)
H. Fischer
R. Tutsch
Pump-probe interference microscope observation for femtosecond-laser induced phenomena
477(4)
Y. Hayasaki
A. Takita
M. Isaka
Three-dimensional shape measurement of dynamic objects with spatially isolated surfaces
481(4)
Q. Zhang
X. Su
L. Xiang
Optical design of a DOE-based laser interferometer for inspection of MEMS/MOEMS
485(4)
M. Jozwik
M. Kujawinska
U. D. Zeitner
K. H. Haugholt
Time Resolved High Resolution Shape and Colour Measurement using Fringe Projection
489(4)
Z. Zhang
D. P. Towers
C. E. Towers
Dynamic 3-D shape measurement techniques with marked fringes tracking
493(4)
X. Su
Q. Zhang
Y. Xiao
L. Xiang
Optical measurement and color map projection system to highlight geometrical features on free form surfaces
497(4)
T. L. Pinto
A. V. Fantin
C. A. Carvalho
A. Albertazzi
Digital holographic recording of large scale objects for metrology and display
501(4)
T. Meeser
S. Huferath Von Lupke
T. Kreis
Multiwavelength laser interferometry
505(4)
B. Mikel
M. Cizek
Z. Buchta
J. Lazar
O. Cip
Accurate and fast three-dimensional imaging with use of fringe projection profilometry
509(4)
A. Li
X. Peng
Y. Yin
Y. Guan
X. Liu
3D vibration analysis of granular materials with two-color digital Fresnel hologrphy
513(6)
P. Tankam
P. Picart
D. Mounier
J.-P. Boileau
V. Tournat
V. Gusev
System for transient spatio-temporal (4D) vibration imaging and non-destructive inspection
519(4)
J. M. Kilpatrick
A. Apostol
V. Markov
Microelements vibration measurement using quasi-heterodyning method and smart-pixel camera
523(5)
A. Styk
M. Kujawinska
P. Lambelet
A. Røyset
S. Beer
Dynamic multipoint vibrometry using spatial light modulators
528(6)
F. Schaal
M. Warber
C. Rembe
T. Haist
W. Osten
Topic 4: Hybrid Measurement Techniques
Optoelectronic method for device characterization and experimental validation of operational performance (invited paper)
534(8)
R. J. Pryputniewicz
Computational inverse holographic imaging: toward perfect reconstruction of wavefield distributions
542(8)
V. Katkovnik
A. Migukin
J. Astola
Cooperative Sensor Approach for holistic geometrical Measurement Tasks on Cutting Tools
550(6)
A. Weckenmann
L. Shaw
View Planning for 3D Reconstruction using Time-of-Flight Camera Data as a-priori Information
556(6)
C. Munkelt
M. Trummer
P. Kuehmstedt
J. Denzler
G. Notni
Stereo vision based approach for extracting features from digital holograms
562(6)
T. Pitkaaho
T. J. Naughton
Flexible Combination of Optical Metrology Strategies for the Automated Assembly of Solid State Lasers
568(4)
R. Schmitt
A. Pavim
A Numerical Simulation Benchmark of Tilt Scanning Interferometry for 3D Metrology
572(4)
G. E. Galizzi
P. D. Ruiz
G. H. Kaufmann
A virtual telecentric fringe projection system
576(4)
K. Haskamp
M. Kastner
E. Reithmeier
Inspection of an extended surface by an active 3D multiresolution technique
580(4)
J. Vargas
R. Restrepo
J. A. Quiroga
T. Belenguer
Automated Multiscale Measurement System for micro optical elements
584(8)
W. Lyda
A. Burla
T. Haist
J. Zimmermann
W. Osten
O. Sawodny
Simulation based sensitivity analysis and optimization of Scatterometry measurements for future semiconductor technology nodes
592(4)
V. Ferreras Paz
T. Schuster
K. Frenner
W. Osten
L. Sziksai
M. Mort
C. Hohle
H. Bloess
Electronic Speckle Pattern Interferometry at Long Infrared Wavelengths. Scattering Requirements
596(6)
J.-F. Vandenrijt
C. Thizy
I. Alexeenko
I. Jorge
I. Lopez
I. S. de Ocariz
G. Pedrini
W. Osten
M. Georges
Topic 5: New Optical Sensors and Measurement Systems
Novel interferometric measurement systems for the characterization of micro-optics (invited paper)
602(9)
H. Ottevaere
H. Thienpont
Design of a micro-optical low coherent interferometer array for the characterisation of MEMS and MOEMS
611(7)
K. Gastinger
K. H. Haugholt
A. Røyset
J. Albero
U. Zeitner
C. Gorecki
Looking for a new generation of MEMS-type confocal microscopes
618(4)
C. Gorecki
S. Bargiel
K. Laszczyk
J. Albero
J. Krezel
M. Kujawinska
Radial in-plane achromatic digital speckle pattern interferometer using an axis-symmetrical diffractive optical element
622(6)
A. Albertazzi
M. R. Viotti
W. A. Kapp
Wavefront Sensor Design based on a Micro-Mirror Array for a High Dynamic Range Measurement at a High Lateral Resolution
628(6)
R. Schmitt
I. Jakobs
K. Vielhaber
Intellectual property in industry and academia: where interests merge? (invited paper)
634(14)
N. Reingand
W. Osten
Moire interferometer for surface mapping with liquid crystal grids
648(8)
J. A. N. Buytaert
J. J. J. Dirckx
High resolution tilt scanning interferometry system for full sensitivity depth-resolved displacement measurements in weakly scattering mateials
656(6)
B. S. H. Burlison
P. D. Ruiz
J. M. Huntley
Multifunctional phase-stepping interferometer for measurement in real time
662(8)
V. Sainov
E. Stoykova
A Wonderful World of Holography, Interferometry, and Optical Testing (honorary lecture)
670(10)
J. C. Wyant
Multifunctional Encoding System for Assessment of Movable Cultural Heritage
680(8)
V. Tornari
E. Bernikola
K. Hatziyannakis
W. Osten
R. M. Grooves
M. Georges
T. Cedric
G. M. Hustinx
J. Rochet
E. Kouloumpi
M. Doulgeridis
T. Green
S. Hackney
Investigation of electronic PCB component with two-color digital holographic interferometry
688(5)
P. Tankam
D. Mounier
E. Moisson
P. Picart
Integrated Microinterferometric Sensor
693(4)
J. Krezel
M. Kujawinska
High Precision Measurement of plane-parallel Parts
697(4)
M. Fleischer
T. Gnausch
D. Supp
J. Becker
Lateral Shearing Interferometry with Simultaneous Detection of both Gradient Fields on a Common Detector Grid
701(4)
V. Nercissian
N. Lindlein
Near infrared large aperture (24 inches) interferometer system development
705(4)
R. Zhu
L. Chen
Z. Gao
Y. He
Q. Wang
R. Guo
J. Li
S. Deng
J. Ma
Interior Geometry Inspection Using Rerouted Fringe Projection
709(4)
O. Abo-Namous
M. Kastner
E. Reithmeier
A Cellular Force Microscopic System for Cell Mechanics Investigation
713(4)
J. Fang
J. Y. Huang
C. Y. Xiong
Candle flame analysis by digital three-wavelength holographic interferometry
717(4)
J.-M. Desse
P. Picart
P. Tankam
Moire fringe generation and phase shifting using a consumer product LCD projector
721(5)
J. J. J. Dirckx
J. A. N. Buytaert
S. A. M. Van Der Jeught
Speckle velocimetry for high accuracy and multi-dimensional odometry
726(4)
T. Charrett
R. P. Tatam
Determination of Refractive Index Changes in Biconical Optical Fiber Taper
730(4)
K. A. Stasiewicz
R. Krajewski
M. Kujawinska
L. R. Jaroszewicz
Prosthodontic crown mechanical integrity study using Speckle Interferometry
734(4)
P. Slangen
S. Corn
M. Fages
F. J. G. Cuisinier
Monitoring of Drying Process of Paints using Lensless Fourier Transform Digital Holography
738(5)
C. Shakher
G. Sheoran
On the Digital Holographic Interferometry of Fibrous Materials: Opto-Mechanical Properties of Fibres
743(4)
K. Yassien
M. Agour
C. von Kopylow
Geometrical camera calibration using lasers and diffractive optical elements
747(4)
M. Bauer
D. Grießbach
A. Hermerschmidt
S. Kruger
M. Scheele
A. Schischmanow
Mesurement of the local displacement field produced by a microindentation using speckle interferometry. Its application to analyse coating adhesion
751(4)
A. E. Dolinko
G. H. Kaufmann
Space-Time Multiplexing in a Stereo-photogrammetry Setup
755(5)
M. Große
R. Kowarschik
Interference Investigation of Concrete Structure and Dynamics During Hydration
760(4)
M. P. Gorsky
P. P. Maksimyak
A. P. Maksimyak
Off-axis Reconstruction Method for Displacement and Strain Distribution Measurement with Phase-Shifting Digital Holography
764(4)
M. Fujigaki
K. Shiotani
R. Nishitani
A. Masaya
Y. Morimoto
``Flying Triangulation'': A motion-robust optical 3D sensor principle
768(4)
S. Ettl
O. Arold
P. Vogt
O. Hybl
Z. Yang
W. Xie
G. Hausler
Laser direct writing of high resolution structures on curved substrates: evaluation of the writing precision
772(6)
M. Hafner
R. Reichle
C. Pruss
W. Osten
Tutorial
Scanning Holography - A tutorial
778(9)
T.-C. Poon
Appendix: New Products 787