E-grāmata: Scanning Probe Microscopy: The Lab on a Tip

Hans J. Hug, Roland Bennewitz, Ernst Meyer

Formāts: PDF+DRM
Sērija : Graduate Texts in Physics
Izdošanas datums: 31-May-2021
Izdevniecība: Springer Nature Switzerland AG
Valoda: eng
ISBN-13: 9783030370893

Citas grāmatas par šo tēmu:

Formāts - PDF+DRM
Cena: 59,47 €*
* ši ir gala cena, t.i., netiek piemērotas nekādas papildus atlaides
Ielikt grozā
Pievienot vēlmju sarakstam
Šī e-grāmata paredzēta tikai personīgai lietošanai. E-grāmatas nav iespējams atgriezt un nauda par iegādātajām e-grāmatām netiek atmaksāta.

Formāts: PDF+DRM
Sērija : Graduate Texts in Physics
Izdošanas datums: 31-May-2021
Izdevniecība: Springer Nature Switzerland AG
Valoda: eng
ISBN-13: 9783030370893

Citas grāmatas par šo tēmu:

DRM restrictions

Kopēšana (kopēt/ievietot):

nav atļauts
Drukāšana:

nav atļauts
Lietošana:

Digitālo tiesību pārvaldība (Digital Rights Management (DRM))
Izdevējs ir piegādājis šo grāmatu šifrētā veidā, kas nozīmē, ka jums ir jāinstalē bezmaksas programmatūra, lai to atbloķētu un lasītu. Lai lasītu šo e-grāmatu, jums ir jāizveido Adobe ID. Vairāk informācijas šeit. E-grāmatu var lasīt un lejupielādēt līdz 6 ierīcēm (vienam lietotājam ar vienu un to pašu Adobe ID).

Nepieciešamā programmatūra
Lai lasītu šo e-grāmatu mobilajā ierīcē (tālrunī vai planšetdatorā), jums būs jāinstalē šī bezmaksas lietotne: PocketBook Reader (iOS / Android)

Lai lejupielādētu un lasītu šo e-grāmatu datorā vai Mac datorā, jums ir nepieciešamid Adobe Digital Editions (šī ir bezmaksas lietotne, kas īpaši izstrādāta e-grāmatām. Tā nav tas pats, kas Adobe Reader, kas, iespējams, jau ir jūsu datorā.)

Jūs nevarat lasīt šo e-grāmatu, izmantojot Amazon Kindle.

Written by three leading experts in the field, this book describes and explains all essential aspects of scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods described. The book covers not only the physical principles behind this popular technique, but also tackles questions on instrument design, the basic features of the different imaging modes, and recurring artifacts. Novel applications and the latest research results are presented, and the book closes with a look at the future prospects of scanning probe microscopy, while also discussing related techniques in the field of nanoscience.

This second edition includes essential scientific updates reflecting the latest research, as well as coverage of new breakthroughs in techniques such as submolecular imaging by atomic force microscopy (AFM), multifrequency AFM, high-speed imaging of biological matter, scanning x-ray microscopy, andtip-enhanced Raman scattering.

The book serves as a general, hands-on guide for all types of classes that address scanning probe microscopy. It is ideally suited for graduate and advanced undergraduate students, either for self-study or as a textbook for a dedicated course on the topic. Furthermore, it is an essential component of any scanning probe microscopy laboratory course and a valuable resource for practicing researchers developing and using scanning probe techniques.

Introduction to Scanning Probe Microscopy.- Overview.- Basic Concepts.- Introduction to Scanning Tunneling Microscopy.- Tunneling: A Quantum-Mechanical Effect.- Instrumental Aspects.- Resolution Limits.- Observation of Confined Electrons.- Spin-Polarized Tunneling.- Observation of the Kondo Effect and Quantum Mirage.- Force Microscopy.- Concept and Instrumental Aspects.- Relevant Forces.- Operation Modes in Force Microscopy.- Contact Force Microscopy.- Dynamic Force Microscopy.- Tapping Mode Force Microscopy.- Further Modes of Force Microscopy.- Force Resolution and Thermal Noise.- High-speed AFM.- Multifrequency AFM.- MFM and Related Techniques.- MFM Operation Modes.- Contrast Formation.- Magnetic Resonance Force Microscopy.- Other Members of the SPM Family.- Artifacts in SPM.- Future Aspects of SPM.

Ernst Meyer is Professor of Physics at the University of Basel and an expert in the field of atomic force microscopy. He has chaired European programmes for the study of nanotribology and is member of the executive board of the Swiss Nanoscience Institute. His research focuses on scientific questions in the fields of nanomechanics and nanoelectronics.

Roland Bennewitz is Professor of Physics at Saarland University and group leader at the Leibniz Institute for New Materials (INM) in Saarbrücken, Germany. His main areas of expertise are high-resolution friction force microscopy, force microscopy of liquid-solid interfaces, and control of adhesion and friction by macromolecular functionalization or ionic liquids. He has chaired international conferences such are the Gordon Research Conference in Tribology 2014 and a Beilstein Symposium on Molecular Mechanisms in Tribology in 2016. He currently serves as on the Editorial Board of the Journal Tribology Letters.

Hans Josef Hug is Professor of Physics at the University of Basel and laboratory head at the Empa - Swiss Federal Laboratories for Materials Testing and Research in Dübendorf, near Zürich, where he leads the laboratory for Magnetic and Functional Thin Films. In 2003 he and his team received the Swiss Technology Award for the development of high resolution and quantitative magnetic force microscopy. His main areas of expertise are magnetism and magnetic thin film systems and scanning force microscopy with a particular emphasis on magnetic force microscopy.

Biežāk uzdotie jautājumi par e-grāmatām