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In-situ Materials Characterization: Across Spatial and Temporal Scales 2014 ed. [Hardback]

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  • Formāts: Hardback, 256 pages, height x width: 235x155 mm, weight: 5266 g, 78 Illustrations, color; 46 Illustrations, black and white; XI, 256 p. 124 illus., 78 illus. in color., 1 Hardback
  • Sērija : Springer Series in Materials Science 193
  • Izdošanas datums: 10-Apr-2014
  • Izdevniecība: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
  • ISBN-10: 3642451519
  • ISBN-13: 9783642451515
  • Hardback
  • Cena: 91,53 €*
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  • Formāts: Hardback, 256 pages, height x width: 235x155 mm, weight: 5266 g, 78 Illustrations, color; 46 Illustrations, black and white; XI, 256 p. 124 illus., 78 illus. in color., 1 Hardback
  • Sērija : Springer Series in Materials Science 193
  • Izdošanas datums: 10-Apr-2014
  • Izdevniecība: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
  • ISBN-10: 3642451519
  • ISBN-13: 9783642451515
The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.

The techniques described in this book will permit access to the real-time dynamics of materials, surface processes, and chemical and biological reactions at various time scales.
Scanning Probe Microscopy on 'Live' Catalysts.- In-situ X-ray
diffraction at synchrotron and Free-Electron-Laser sources.- Advanced in situ
transmission electron microscopy.- Ultra-fast TEM and Electron Diffraction.-
In-Situ Materials Characterization with FIB/SEM.- In-situ X-ray photoelectron
spectroscopy.- Real-time probing of photo-induced molecular processes in
liquids by ultrafast  X-ray absorption spectroscopy.- Time-Resolved Neutron
Scattering.- Novel Detectors for Ultra-fast XRD, TEM and ED Characterization.