Selected peer-reviewed full text papers from the 2nd International Conference on Advanced Materials, Processing and Testing Technology (AMPTT 2020) Selected, peer-reviewed papers from the 2nd International Conference on Advance...Lasīt vairāk
Editors Shiou, Jeng, and Chen present students, academics, researchers, and professionals working in a wide variety of contexts with a collection of peer reviewed papers selected from research presented at the eighteenth International Conference on M...Lasīt vairāk
A committee of scientists reviewed presentations at the most recent of the biennial gatherings and selected a mere 126 for publication. They cover general problems of measurement; micromeasurements, nanomeasurements, and metrology; optical and x-ray...Lasīt vairāk
