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E-grāmata: Encapsulation Technologies for Electronic Applications

(Staff Engineer, Qualcomm, San Diego, CA, USA), (CALCE (Center for Advanc), (Department of Mechanical Engineering, University of Houston, USA and visiting scholar, Mechanical Engineering and Materials Science Department, Rice University), Series edited by
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Encapsulation Technologies for Electronic Applications, Second Edition, offers an updated, comprehensive discussion of encapsulants in electronic applications, with a primary emphasis on the encapsulation of microelectronic devices and connectors and transformers. It includes sections on 2-D and 3-D packaging and encapsulation, encapsulation materials, including environmentally friendly 'green' encapsulants, and the properties and characterization of encapsulants. Furthermore, this book provides an extensive discussion on the defects and failures related to encapsulation, how to analyze such defects and failures, and how to apply quality assurance and qualification processes for encapsulated packages.

In addition, users will find information on the trends and challenges of encapsulation and microelectronic packages, including the application of nanotechnology.

Increasing functionality of semiconductor devices and higher end used expectations in the last 5 to 10 years has driven development in packaging and interconnected technologies. The demands for higher miniaturization, higher integration of functions, higher clock rates and data, and higher reliability influence almost all materials used for advanced electronics packaging, hence this book provides a timely release on the topic.

  • Provides guidance on the selection and use of encapsulants in the electronics industry, with a particular focus on microelectronics
  • Includes coverage of environmentally friendly 'green encapsulants'
  • Presents coverage of faults and defects, and how to analyze and avoid them

Recenzijas

"Microelectronics packaging engineers will find this book to be a useful reference for various material properties. Those wanting to learn about electronics packaging could use this book to learn about packaging fundamentals and state-of-the-art in encapsulation for microelectronics." --IEEE Electrical Insulation Magazine

"This book describes encapsulants and packaging processes commonly used in the electronic industry. Electronic and microelectronic industry professionals, working in packaging areas will find this book to be a good source for up-to-date information on various process, testing, and quality assurance methods in the microelectronic packaging world." --IEEE Electrical Insulation Magazine

About the author ix
1 Introduction
1(46)
1.1 Introduction
1(1)
1.2 Historical overview
2(5)
1.3 Electronic packaging
7(3)
1.4 Encapsulated microelectronic packages
10(22)
1.5 Hermetic packages
32(3)
1.6 Encapsulants
35(1)
1.7 Plastic versus hermetic packages
36(5)
1.8 Summary
41(1)
References
42(3)
Further Reading
45(2)
2 Plastic encapsulant materials
47(76)
2.1 Introduction
47(1)
2.2 Chemistry overview
48(6)
2.3 Molding compounds
54(33)
2.4 Glob-top encapsulants
87(1)
2.5 Potting and casting encapsulants
88(8)
2.6 Underfill encapsulants
96(1)
2.7 Printing encapsulants
96(4)
2.8 Environment-friendly or "green" encapsulants
100(16)
2.9 Summary
116(1)
References
117(4)
Further Reading
121(2)
3 Encapsulation process technology
123(60)
3.1 Introduction
123(2)
3.2 Molding technology
125(15)
3.3 Glob-topping technology
140(5)
3.4 Potting and casting technology
145(2)
3.5 Underfilling technology
147(8)
3.6 Printing encapsulation technology
155(1)
3.7 Encapsulation of 2D wafer-level packages
156(4)
3.8 Encapsulation of 3D packages
160(10)
3.9 Dual side molding
170(1)
3.10 Encapsulation of MEMS
171(2)
3.11 Cleaning and surface preparation
173(4)
3.12 Summary
177(1)
References
178(5)
4 Injection molding
183(12)
4.1 Introduction
183(1)
4.2 Injection molding
183(8)
4.3 Fluid-assisted injection molding
191(1)
4.4 Cavity direct injection molding
192(1)
References
193(2)
5 Compression encapsulation
195(26)
5.1 Introduction
195(1)
5.2 Mold solutions
195(1)
5.3 Advantages of compression molding
196(1)
5.4 Compression molding process
196(15)
5.5 System-in-package encapsulation using compression molding
211(4)
5.6 Wafer-level compression molding
215(2)
5.7 Summary
217(1)
References
217(1)
Further reading
218(3)
6 Characterization of encapsulant properties
221(38)
6.1 Introduction
221(1)
6.2 Manufacturing properties
222(6)
6.3 Hygrothermomechanical properties
228(22)
6.4 Electrical properties
250(2)
6.5 Chemical properties
252(3)
6.6 Summary
255(1)
References
255(4)
7 Encapsulation defects and failures
259(58)
7.1 Introduction
260(1)
7.2 Overview of package defects and failures
260(9)
7.3 Encapsulation defects
269(14)
7.4 Encapsulation failures
283(15)
7.5 Failure accelerators
298(10)
7.6 Microsystem sensor failure
308(1)
7.7 Summary
309(1)
References
309(8)
8 Defect and failure analysis techniques for encapsulated microelectronics
317(58)
8.1 Introduction
318(1)
8.2 General defect and failure analysis procedures
318(11)
8.3 Optical microscopy
329(3)
8.4 Scanning acoustic microscopy
332(16)
8.5 X-ray microscopy
348(10)
8.6 X-ray fluorescence spectroscopy
358(1)
8.7 Electron microscopy
358(8)
8.8 Atomic force microscopy
366(1)
8.9 Infrared microscopy
367(2)
8.10 Selection of failure analysis techniques
369(3)
8.11 Summary
372(1)
References
372(3)
9 Qualification and quality assurance
375(56)
9.1 Introduction
376(1)
9.2 A brief history of qualification and reliability assessment
376(4)
9.3 Qualification process overview
380(4)
9.4 Virtual qualification
384(9)
9.5 Product qualification
393(9)
9.6 Qualification accelerated tests
402(8)
9.7 Industry practices
410(4)
9.8 Quality assurance
414(11)
9.9 Summary
425(1)
References
426(5)
10 Trends and challenges
431(50)
10.1 Introduction
431(1)
10.2 Microelectronic device structure and packaging
431(7)
10.3 Extreme high- and low-temperature electronics
438(14)
10.4 Emerging technologies
452(16)
10.5 Trends in IC packaging
468(6)
10.6 Summary
474(1)
References
475(4)
Further reading
479(2)
Index 481
Dr. Haleh Ardebili has a BS honors degree in Engineering Science and Mechanics from Pennsylvania State University at University Park, MS degree in Mechanical Engineering from Johns Hopkins University and PhD degree in Mechanical Engineering from University of Maryland at College Park. She has three years of industry experience as research scientist at General Electric Global Research Center at Niskayuna, New York. She is a recipient of GE Invention Fulcrum of Progress Award. She has several years of experience teaching engineering courses at University of Houston. In Sep 2010, she joined as Assistant Professor in the Mechanical Engineering Department at University of Houston. Her research work is mainly focused on nanomaterials for Energy Storage and Electronics. Jiawei Zhang has 10 years of experience working in the development and implementation of advanced packages. He is currently Staff Engineer at Qualcomm, San Diego. Previously, he served as Development Senior Staff Engineer at Broadcom Corporation responsible for IC package co-design flow (Die/Package/System). He is experienced in advanced package, FCBGA, MCM, and SiP. He has published over 30 external papers, including two which won best Conference Paper Awards (2012 IMAPS and 2014 SMTAI) He has been honored with one Broadcom Corporation Outstanding Technical Achievement Awards for design flow. He also served on the IWLPC Technical Committee from 2013 to 2015 and as the session Chair in 2013. He is the founder and director of CALCE (Center for Advanced Life Cycle Engineering) at the University of Maryland, which is funded by over 150 of the worlds leading electronics companies at more than US$6M/year. He is a Professional Engineer, an IEEE Fellow, an ASME Fellow, an SAE Fellow, and an IMAPS Fellow. He is currently serving as editor-in-chief of Circuit World. He served as editor-in-chief of IEEE Access for 6 years, as editor-in-chief of IEEE Transactions on Reliability for 9 years, and as editor-in-chief of Microelectronics Reliability for 16 years. He has also served on three U.S. National Academy of Science studies, two U.S. Congressional investigations in automotive safety, and as an expert to the U.S. FDA. He is also a Chair Professor. He consults for 22 major international electronics companies, providing expertise in strategic planning, design, test, prognostics, IP and risk assessment of electronic products and systems. has his own consulting firm, AvanTeco, specializing in materials and processes for electronics. He holds a BS in Chemistry from Fordham University and a PhD in Chemistry from Princeton University, where he was a DuPont Senior Fellow. His areas of expertise include materials and processes for electronic applications, primarily for high reliability systems, hybrid microcircuits, printed wiring circuits, and other interconnect packaging technologies. He is an expert on polymeric materials including adhesives, coatings, encapsulants, insulation, reliability based on failure modes and mechanisms. Dr. Licari has had a forty-year career dedicated to the study and advancement of microelectronic materials and processes. Notable achievements throughout this career include conducting the first studies on the reliability and use of die-attach adhesives for microcircuits, which he did in the mid-1970s through the early 1980s, making industry and the government aware of the degrading effects of trace amounts of ionic contaminants in epoxy resins. He conducted early exploratory development on the use of non-noble metal (Cu) thick-film conductor pastes for thick-film ceramic circuits. He carried out the first studies on the use of Parylene as a dielectric and passivation coating for MOS devices and as a particle immobilizer for hybrid microcircuits. He developed the first photo-definable thick-film conductor and resistor pastes that were the forerunners of DuPonts Fodel process, for which he received a patent was granted in England. And he developed the first photocurable epoxy coating using cationic photoinitiation by employing a diazonium salt as the catalytic agent (U.S. 3205157) . The work was referenced as pioneering work in a review article by J.V. Crivello The Discovery ad Development of Onium Salt Cationic Photoinitiators,” J. Polymer Chemistry (1999)