Encapsulation Technologies for Electronic Applications, Second Edition, offers an updated, comprehensive discussion of encapsulants in electronic applications, with a primary emphasis on the encapsulation of microelectronic devices and connectors and transformers. It includes sections on 2-D and 3-D packaging and encapsulation, encapsulation materials, including environmentally friendly 'green' encapsulants, and the properties and characterization of encapsulants. Furthermore, this book provides an extensive discussion on the defects and failures related to encapsulation, how to analyze such defects and failures, and how to apply quality assurance and qualification processes for encapsulated packages.
In addition, users will find information on the trends and challenges of encapsulation and microelectronic packages, including the application of nanotechnology.
Increasing functionality of semiconductor devices and higher end used expectations in the last 5 to 10 years has driven development in packaging and interconnected technologies. The demands for higher miniaturization, higher integration of functions, higher clock rates and data, and higher reliability influence almost all materials used for advanced electronics packaging, hence this book provides a timely release on the topic.
- Provides guidance on the selection and use of encapsulants in the electronics industry, with a particular focus on microelectronics
- Includes coverage of environmentally friendly 'green encapsulants'
- Presents coverage of faults and defects, and how to analyze and avoid them
Recenzijas
"Microelectronics packaging engineers will find this book to be a useful reference for various material properties. Those wanting to learn about electronics packaging could use this book to learn about packaging fundamentals and state-of-the-art in encapsulation for microelectronics." --IEEE Electrical Insulation Magazine
"This book describes encapsulants and packaging processes commonly used in the electronic industry. Electronic and microelectronic industry professionals, working in packaging areas will find this book to be a good source for up-to-date information on various process, testing, and quality assurance methods in the microelectronic packaging world." --IEEE Electrical Insulation Magazine
About the author |
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1 | (46) |
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1 | (1) |
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2 | (5) |
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7 | (3) |
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1.4 Encapsulated microelectronic packages |
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10 | (22) |
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32 | (3) |
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35 | (1) |
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1.7 Plastic versus hermetic packages |
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36 | (5) |
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41 | (1) |
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42 | (3) |
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45 | (2) |
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2 Plastic encapsulant materials |
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47 | (76) |
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47 | (1) |
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48 | (6) |
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54 | (33) |
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2.4 Glob-top encapsulants |
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87 | (1) |
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2.5 Potting and casting encapsulants |
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88 | (8) |
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2.6 Underfill encapsulants |
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96 | (1) |
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2.7 Printing encapsulants |
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96 | (4) |
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2.8 Environment-friendly or "green" encapsulants |
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100 | (16) |
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116 | (1) |
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117 | (4) |
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121 | (2) |
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3 Encapsulation process technology |
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123 | (60) |
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123 | (2) |
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125 | (15) |
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3.3 Glob-topping technology |
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140 | (5) |
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3.4 Potting and casting technology |
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145 | (2) |
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3.5 Underfilling technology |
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147 | (8) |
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3.6 Printing encapsulation technology |
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155 | (1) |
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3.7 Encapsulation of 2D wafer-level packages |
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156 | (4) |
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3.8 Encapsulation of 3D packages |
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160 | (10) |
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170 | (1) |
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3.10 Encapsulation of MEMS |
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171 | (2) |
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3.11 Cleaning and surface preparation |
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173 | (4) |
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177 | (1) |
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178 | (5) |
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183 | (12) |
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183 | (1) |
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183 | (8) |
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4.3 Fluid-assisted injection molding |
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191 | (1) |
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4.4 Cavity direct injection molding |
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192 | (1) |
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193 | (2) |
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5 Compression encapsulation |
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195 | (26) |
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195 | (1) |
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195 | (1) |
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5.3 Advantages of compression molding |
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196 | (1) |
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5.4 Compression molding process |
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196 | (15) |
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5.5 System-in-package encapsulation using compression molding |
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211 | (4) |
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5.6 Wafer-level compression molding |
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215 | (2) |
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217 | (1) |
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217 | (1) |
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218 | (3) |
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6 Characterization of encapsulant properties |
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221 | (38) |
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221 | (1) |
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6.2 Manufacturing properties |
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222 | (6) |
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6.3 Hygrothermomechanical properties |
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228 | (22) |
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6.4 Electrical properties |
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250 | (2) |
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252 | (3) |
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255 | (1) |
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255 | (4) |
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7 Encapsulation defects and failures |
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259 | (58) |
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260 | (1) |
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7.2 Overview of package defects and failures |
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260 | (9) |
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7.3 Encapsulation defects |
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269 | (14) |
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7.4 Encapsulation failures |
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283 | (15) |
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298 | (10) |
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7.6 Microsystem sensor failure |
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308 | (1) |
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309 | (1) |
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309 | (8) |
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8 Defect and failure analysis techniques for encapsulated microelectronics |
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317 | (58) |
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318 | (1) |
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8.2 General defect and failure analysis procedures |
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318 | (11) |
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329 | (3) |
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8.4 Scanning acoustic microscopy |
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332 | (16) |
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348 | (10) |
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8.6 X-ray fluorescence spectroscopy |
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358 | (1) |
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358 | (8) |
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8.8 Atomic force microscopy |
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366 | (1) |
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367 | (2) |
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8.10 Selection of failure analysis techniques |
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369 | (3) |
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372 | (1) |
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372 | (3) |
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9 Qualification and quality assurance |
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375 | (56) |
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376 | (1) |
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9.2 A brief history of qualification and reliability assessment |
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376 | (4) |
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9.3 Qualification process overview |
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380 | (4) |
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9.4 Virtual qualification |
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384 | (9) |
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9.5 Product qualification |
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393 | (9) |
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9.6 Qualification accelerated tests |
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402 | (8) |
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410 | (4) |
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414 | (11) |
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425 | (1) |
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426 | (5) |
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431 | (50) |
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431 | (1) |
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10.2 Microelectronic device structure and packaging |
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431 | (7) |
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10.3 Extreme high- and low-temperature electronics |
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438 | (14) |
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10.4 Emerging technologies |
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452 | (16) |
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10.5 Trends in IC packaging |
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468 | (6) |
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474 | (1) |
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475 | (4) |
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479 | (2) |
Index |
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481 | |
Dr. Haleh Ardebili has a BS honors degree in Engineering Science and Mechanics from Pennsylvania State University at University Park, MS degree in Mechanical Engineering from Johns Hopkins University and PhD degree in Mechanical Engineering from University of Maryland at College Park. She has three years of industry experience as research scientist at General Electric Global Research Center at Niskayuna, New York. She is a recipient of GE Invention Fulcrum of Progress Award. She has several years of experience teaching engineering courses at University of Houston. In Sep 2010, she joined as Assistant Professor in the Mechanical Engineering Department at University of Houston. Her research work is mainly focused on nanomaterials for Energy Storage and Electronics. Jiawei Zhang has 10 years of experience working in the development and implementation of advanced packages. He is currently Staff Engineer at Qualcomm, San Diego. Previously, he served as Development Senior Staff Engineer at Broadcom Corporation responsible for IC package co-design flow (Die/Package/System). He is experienced in advanced package, FCBGA, MCM, and SiP. He has published over 30 external papers, including two which won best Conference Paper Awards (2012 IMAPS and 2014 SMTAI) He has been honored with one Broadcom Corporation Outstanding Technical Achievement Awards for design flow. He also served on the IWLPC Technical Committee from 2013 to 2015 and as the session Chair in 2013. He is the founder and director of CALCE (Center for Advanced Life Cycle Engineering) at the University of Maryland, which is funded by over 150 of the worlds leading electronics companies at more than US$6M/year. He is a Professional Engineer, an IEEE Fellow, an ASME Fellow, an SAE Fellow, and an IMAPS Fellow. He is currently serving as editor-in-chief of Circuit World. He served as editor-in-chief of IEEE Access for 6 years, as editor-in-chief of IEEE Transactions on Reliability for 9 years, and as editor-in-chief of Microelectronics Reliability for 16 years. He has also served on three U.S. National Academy of Science studies, two U.S. Congressional investigations in automotive safety, and as an expert to the U.S. FDA. He is also a Chair Professor. He consults for 22 major international electronics companies, providing expertise in strategic planning, design, test, prognostics, IP and risk assessment of electronic products and systems. has his own consulting firm, AvanTeco, specializing in materials and processes for electronics. He holds a BS in Chemistry from Fordham University and a PhD in Chemistry from Princeton University, where he was a DuPont Senior Fellow. His areas of expertise include materials and processes for electronic applications, primarily for high reliability systems, hybrid microcircuits, printed wiring circuits, and other interconnect packaging technologies. He is an expert on polymeric materials including adhesives, coatings, encapsulants, insulation, reliability based on failure modes and mechanisms. Dr. Licari has had a forty-year career dedicated to the study and advancement of microelectronic materials and processes. Notable achievements throughout this career include conducting the first studies on the reliability and use of die-attach adhesives for microcircuits, which he did in the mid-1970s through the early 1980s, making industry and the government aware of the degrading effects of trace amounts of ionic contaminants in epoxy resins. He conducted early exploratory development on the use of non-noble metal (Cu) thick-film conductor pastes for thick-film ceramic circuits. He carried out the first studies on the use of Parylene as a dielectric and passivation coating for MOS devices and as a particle immobilizer for hybrid microcircuits. He developed the first photo-definable thick-film conductor and resistor pastes that were the forerunners of DuPonts Fodel process, for which he received a patent was granted in England. And he developed the first photocurable epoxy coating using cationic photoinitiation by employing a diazonium salt as the catalytic agent (U.S. 3205157) . The work was referenced as pioneering work in a review article by J.V. Crivello The Discovery ad Development of Onium Salt Cationic Photoinitiators, J. Polymer Chemistry (1999)